| 2008 |
|---|
| 9 | EE | Yuzo Takamatsu,
Hiroshi Takahashi,
Yoshinobu Higami,
Takashi Aikyo,
Koji Yamazaki:
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information.
IEICE Transactions 91-D(3): 675-682 (2008) |
| 8 | EE | Masayuki Arai,
Satoshi Fukumoto,
Kazuhiko Iwasaki,
Tatsuru Matsuo,
Takahisa Hiraide,
Hideaki Konishi,
Michiaki Emori,
Takashi Aikyo:
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate.
IEICE Transactions 91-D(3): 726-735 (2008) |
| 7 | EE | Hiroshi Takahashi,
Yoshinobu Higami,
Shuhei Kadoyama,
Yuzo Takamatsu,
Koji Yamazaki,
Takashi Aikyo,
Yasuo Sato:
Post-BIST Fault Diagnosis for Multiple Faults.
IEICE Transactions 91-D(3): 771-775 (2008) |
| 2007 |
|---|
| 6 | EE | Seiji Kajihara,
Shohei Morishima,
Masahiro Yamamoto,
Xiaoqing Wen,
Masayasu Fukunaga,
Kazumi Hatayama,
Takashi Aikyo:
Estimation of delay test quality and its application to test generation.
ICCAD 2007: 413-417 |
| 2006 |
|---|
| 5 | EE | Hiroshi Takahashi,
Shuhei Kadoyama,
Yoshinobu Higami,
Yuzo Takamatsu,
Koji Yamazaki,
Takashi Aikyo,
Yasuo Sato:
Effective Post-BIST Fault Diagnosis for Multiple Faults.
DFT 2006: 401-109 |
| 2000 |
|---|
| 4 | EE | Takashi Aikyo:
Issues on SOC testing in DSM area: embedded tutorial.
ASP-DAC 2000: 515-516 |
| 1997 |
|---|
| 3 | EE | Michiaki Emori,
Junko Kumagai,
Koichi Itaya,
Takashi Aikyo,
Tomoko Anan,
Junichi Niimi:
ATREX : Design for Testability System for Mega Gate LSIs.
Asian Test Symposium 1997: 126- |
| 2 | EE | Douglas Chang,
Mike Tien-Chien Lee,
Malgorzata Marek-Sadowska,
Takashi Aikyo,
Kwang-Ting Cheng:
A Test Synthesis Approach to Reducing BALLAST DFT Overhead.
DAC 1997: 466-471 |
| 1986 |
|---|
| 1 | | Takashi Aikyo,
Y. Hatano,
J. Ishii,
N. Karasawa,
S. Fujii:
An Automatic Test Generation System for Large Scale Gate Arrays.
COMPCON 1986: 445-451 |
