| 2007 |
|---|
| 3 | EE | Matthias Beck,
Olivier Barondeau,
Martin Kaibel,
Frank Poehl,
Xijiang Lin,
Ron Press:
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality
CoRR abs/0710.4763: (2007) |
| 2005 |
|---|
| 2 | EE | Matthias Beck,
Olivier Barondeau,
Martin Kaibel,
Frank Poehl,
Xijiang Lin,
Ron Press:
Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality.
DATE 2005: 56-61 |
| 1 | EE | Matthias Beck,
Olivier Barondeau,
Frank Poehl,
Xijiang Lin,
Ron Press:
Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study.
VTS 2005: 223-228 |
