Serge Bernard

2008
17		Fabien Soulier, Lionel Gouyet, Guy Cathébras, Serge Bernard, David Guiraud, Yves Bertrand: Considerations on Improving the Design of CUFF Electrode for ENG Recording - Geometrical Approach, Dedicated IC, Sensitivity, Noise Rejection. BIODEVICES (2) 2008: 180-185
2007
16	EE	Philippe Cauvet, Serge Bernard, Michel Renovell: System-in-Package, a Combination of Challenges and Solutions. European Test Symposium 2007: 193-199
15	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2007: 211-216
2006
14	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2006: 159-164
13	EE	V. Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard, J. M. Janik, B. Agnus, Philippe Cauvet, Ph. Gandy: A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. European Test Symposium 2006: 193-198
12	EE	Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Design & Test of Computers 23(3): 234-243 (2006)
11	EE	Vincent Kerzerho, Serge Bernard, Philippe Cauvet, J. M. Janik: A First Step for an INL Spectral-Based BIST: The Memory Optimization. J. Electronic Testing 22(4-6): 351-357 (2006)
2005
10	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electronic Testing 21(3): 291-298 (2005)
2003
9	EE	Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209
8	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: A-to-D converters static error detection from dynamic parameter measurement. Microelectronics Journal 34(10): 945-953 (2003)
2002
7	EE	Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival: European Network for Test Education. DELTA 2002: 230-234
2001
6	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Implementation of a linear histogram BIST for ADCs. DATE 2001: 590-595
5	EE	Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: Analog BIST Generator for ADC Testing. DFT 2001: 338-346
4		Michel Renovell, Jean Marc Galliere, Florence Azaïs, Serge Bernard, Yves Bertrand: Boolean and current detection of MOS transistor with gate oxide short. ITC 2001: 1039-1048
3		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SOC 2001: 425-436
2	EE	Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell: A Low-Cost Adaptive Ramp Generator for Analog BIST Applications. VTS 2001: 266-271
2000
1	EE	Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand: Hardware Resource Minimization for Histogram-Based ADC BIST. VTS 2000: 247-254

Coauthor Index

1	B. Agnus	[13]
2	Florence Azaïs	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [12] [14] [15]
3	Yves Bertrand	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [17]
4	Lilian Bossuet	[13]
5	Guy Cathébras	[17]
6	Philippe Cauvet	[11] [12] [13] [14] [15] [16]
7	Mariane Comte	[8] [9] [10] [12] [14] [15]
8	Dominique Dallet	[13]
9	Marie-Lise Flottes	[7]
10	V. Fresnaud	[13]
11	Jean Marc Galliere	[4]
12	Ph. Gandy	[13]
13	Lionel Gouyet	[17]
14	David Guiraud	[17]
15	J. M. Janik	[11] [13]
16	Vincent Kerzerho	[11] [12] [14] [15]
17	Laurent Latorre	[7]
18	Regis Lorival	[7]
19	Xavier Michel	[2]
20	Michel Renovell	[1] [2] [3] [4] [5] [6] [8] [9] [10] [12] [14] [15] [16]
21	Fabien Soulier	[17]