| 2007 |
|---|
| 11 | EE | R. Frost Brandenburg,
D. Rudolph,
Christian Galke,
René Kothe,
Heinrich Theodor Vierhaus:
A Configurable Modular Test Processor and Scan Controller Architecture.
IOLTS 2007: 277-284 |
| 2006 |
|---|
| 10 | | Christian Galke,
René Kothe,
Heinrich Theodor Vierhaus:
Logic Self Repair.
ARCS Workshops 2006: 36-44 |
| 9 | | René Kothe,
Christian Galke,
S. Schultke,
H. Froeschke,
S. Gaede,
Heinrich Theodor Vierhaus:
Hardware/Software Based Hierarchical Self Test for SoCs.
DDECS 2006: 159-160 |
| 8 | EE | Christian Galke,
U. Gätzschmann,
Heinrich Theodor Vierhaus:
Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes.
DSD 2006: 433-438 |
| 7 | EE | Christian Galke,
René Kothe,
S. Schultke,
K. Winkler,
J. Honko,
Heinrich Theodor Vierhaus:
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.
IOLTS 2006: 181-182 |
| 2005 |
|---|
| 6 | EE | René Kothe,
Christian Galke,
Heinrich Theodor Vierhaus:
A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features.
IOLTS 2005: 241-246 |
| 2004 |
|---|
| 5 | EE | Claudia Kretzschmar,
Christian Galke,
Heinrich Theodor Vierhaus:
A Hierarchical Self Test Scheme for SoCs.
IOLTS 2004: 37-44 |
| 2003 |
|---|
| 4 | EE | Christian Galke,
Marcus Grabow,
Heinrich Theodor Vierhaus:
Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip.
IOLTS 2003: 183- |
| 2002 |
|---|
| 3 | EE | Christian Galke,
Matthias Pflanz,
Heinrich Theodor Vierhaus:
A Test Processor Concept for Systems-on-a-Chip.
ICCD 2002: 210- |
| 2 | EE | Christian Galke,
Matthias Pflanz,
Heinrich Theodor Vierhaus:
On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures.
IOLTW 2002: 178 |
| 1 | EE | Matthias Pflanz,
K. Walther,
Christian Galke,
Heinrich Theodor Vierhaus:
On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check.
IOLTW 2002: 69-73 |
