Guido Groeseneken

2006
10	EE	S. Thijs, M. Natarajan Iyer, D. Linten, Wutthinan Jeamsaksiri, T. Daenen, Robin Degraeve, Andries Scholten, Stefaan Decoutere, Guido Groeseneken: Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. Microelectronics Reliability 46(5-6): 702-712 (2006)
2005
9	EE	Vesselin K. Vassilev, S. Thijs, P. L. Segura, P. Wambacq, Paul Leroux, Guido Groeseneken, M. I. Natarajan, H. E. Maes, Michiel Steyaert: ESD-RF co-design methodology for the state of the art RF-CMOS blocks. Microelectronics Reliability 45(2): 255-268 (2005)
8	EE	Y.-L. Li, Zs. Tökei, Ph. Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005)
7	EE	Vesselin K. Vassilev, V. A. Vashchenko, Ph. Jansen, Guido Groeseneken, M. ter Beek: ESD circuit model based protection network optimisation for extended-voltage NMOS drivers. Microelectronics Reliability 45(9-11): 1430-1435 (2005)
2003
6	EE	Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, S. Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes: High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectronics Reliability 43(7): 1011-1020 (2003)
2002
5	EE	Ben Kaczer, Robin Degraeve, M. Rasras, A. De Keersgieter, K. Van de Mieroop, Guido Groeseneken: Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study. Microelectronics Reliability 42(4-5): 555-564 (2002)
4	EE	Bart Keppens, V. De Heyn, M. Natarajan Iyer, Vesselin K. Vassilev, Guido Groeseneken: Significance of the failure criterion on transmission line pulse testing. Microelectronics Reliability 42(6): 901-907 (2002)
3	EE	E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen: Statistical aspects of the degradation of LDD nMOSFETs. Microelectronics Reliability 42(9-11): 1409-1413 (2002)
2001
2	EE	K. Bock, Bart Keppens, V. De Heyn, Guido Groeseneken, L. Y. Ching, A. Naem: Influence of gate length on ESD-performance for deep submicron CMOS technology. Microelectronics Reliability 41(3): 375-383 (2001)
1	EE	R. Dreesen, K. Croes, J. Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken: A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectronics Reliability 41(3): 437-443 (2001)

Coauthor Index

1	E. Andries	[3]
2	M. ter Beek	[7]
3	K. Bock	[2]
4	Ward De Ceuninck	[1] [3]
5	L. Y. Ching	[2]
6	K. Croes	[1] [3]
7	Jan D'Haen	[3]
8	Marc D'Olieslaeger	[3]
9	T. Daenen	[10]
10	Stefaan Decoutere	[10]
11	Robin Degraeve	[5] [10]
12	R. Dreesen	[1] [3]
13	V. De Heyn	[2] [4] [6]
14	M. Natarajan Iyer	[4] [6] [10]
15	Ph. Jansen	[7]
16	Wutthinan Jeamsaksiri	[10]
17	S. Jenei	[6]
18	Ben Kaczer	[5]
19	A. De Keersgieter	[5]
20	Bart Keppens	[2] [4]
21	Paul Leroux	[9]
22	Y.-L. Li	[8]
23	D. Linten	[10]
24	K. F. Lo	[3]
25	H. E. Maes	[6] [9]
26	Karen Maex	[8]
27	J. Manca	[1]
28	K. Van de Mieroop	[5]
29	A. Naem	[2]
30	M. I. Natarajan	[9]
31	A. Pergoot	[1]
32	M. Rasras	[5]
33	Ph. Roussel	[8]
34	Luc De Schepper	[1] [3]
35	Andries Scholten	[10]
36	P. L. Segura	[9]
37	Michiel Steyaert	[6] [9]
38	S. Thijs	[6] [9] [10]
39	Zs. Tökei	[8]
40	V. A. Vashchenko	[7]
41	Vesselin K. Vassilev	[4] [6] [7] [9]
42	R. Venegas	[6]
43	P. Wambacq	[9]

Colors in the list of coauthors