| 2006 |
|---|
| 9 | EE | N. Dumas,
Florence Azaïs,
Laurent Latorre,
Pascal Nouet:
Electro-thermal Stimuli for MEMS Testing in FSBM Technology.
J. Electronic Testing 22(2): 189-198 (2006) |
| 2005 |
|---|
| 8 | EE | N. Dumas,
Florence Azaïs,
Laurent Latorre,
Pascal Nouet:
On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor.
VTS 2005: 213-218 |
| 2004 |
|---|
| 7 | EE | Laurent Latorre,
Vincent Beroulle,
Pascal Nouet:
Design of CMOS MEMS based on mechanical resonators using a RF simulation approach.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(6): 962-967 (2004) |
| 2002 |
|---|
| 6 | EE | Vincent Beroulle,
Yves Bertrand,
Laurent Latorre,
Pascal Nouet:
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems.
DATE 2002: 1120 |
| 5 | EE | Yves Bertrand,
Marie-Lise Flottes,
Florence Azaïs,
Serge Bernard,
Laurent Latorre,
Regis Lorival:
European Network for Test Education.
DELTA 2002: 230-234 |
| 4 | EE | Vincent Beroulle,
Yves Bertrand,
Laurent Latorre,
Pascal Nouet:
Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems.
VTS 2002: 439-444 |
| 2001 |
|---|
| 3 | | Vincent Beroulle,
Laurent Latorre,
M. Dardalhon,
C. Oudea,
G. Perez,
F. Pressecq,
Pascal Nouet:
Impact of Technology Spreading on MEMS design Robustness.
VLSI-SOC 2001: 241-251 |
| 2 | | Vincent Beroulle,
Yves Bertrand,
Laurent Latorre,
Pascal Nouet:
Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing.
VLSI-SOC 2001: 461-472 |
| 1999 |
|---|
| 1 | EE | Laurent Latorre,
Yves Bertrand,
P. Hazard,
F. Pressecq,
Pascal Nouet:
Design, Characterization & Modelling of a CMOS Magnetic Field Sensor.
DATE 1999: 239-243 |
