Barend van den Nieuwelaar
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2006
1
EE
Martijn Hendriks
, Barend van den Nieuwelaar,
Frits W. Vaandrager
: Model checker aided design of a controller for a wafer scanner.
STTT 8
(6): 633-647 (2006)
Coauthor
Index
1
Martijn Hendriks
[
1
]
2
Frits W. Vaandrager
[
1
]
Copyright ©
Wed May 28 02:56:03 2008 by
Michael Ley
(
ley@uni-trier.de
)
