| 2007 |
|---|
| 9 | EE | Carol Stolicny:
ITC 2006 panels.
IEEE Design & Test of Computers 24(1): 94-96 (2007) |
| 2006 |
|---|
| 8 | EE | Carol Stolicny:
ITC 2005 panels.
IEEE Design & Test of Computers 23(2): 164-166 (2006) |
| 2005 |
|---|
| 7 | EE | Carol Stolicny:
ITC 2004 panels: Part 1.
IEEE Design & Test of Computers 22(2): 186-189 (2005) |
| 2004 |
|---|
| 6 | | Carol Stolicny,
Tapio Koivukangas,
Rubin A. Parekhji,
Ian G. Harris,
Rob Aitken:
ITC 2003 panels: Part 1.
IEEE Design & Test of Computers 21(2): 160-163 (2004) |
| 5 | | Carol Stolicny,
Mustapha Slamani,
Fidel Muradali,
Geir Eide,
Mike Li:
ITC 2003 panels: Part 2.
IEEE Design & Test of Computers 21(3): 175-176 (2004) |
| 2003 |
|---|
| 4 | | Carol Stolicny:
ITC 2002 Panels.
IEEE Design & Test of Computers 20(1): 88-90 (2003) |
| 3 | | Carol Stolicny:
ITC 2002 Panels: Part 2.
IEEE Design & Test of Computers 20(2): 90-91 (2003) |
| 1998 |
|---|
| 2 | EE | Carol Stolicny,
Richard Davies,
Pamela McKernan,
Tuyen Truong:
Alpha 21164 Manufacturing Test Development and Coverage Analysis.
IEEE Design & Test of Computers 15(3): 98-104 (1998) |
| 1997 |
|---|
| 1 | | Carol Stolicny,
Richard Davies,
Pamela McKernan,
Tuyen Truong:
Manufacturing Pattern Development for the Alpha 21164 Microprocessor.
ITC 1997: 278-285 |
