| 2008 |
| 13 | EE | Westley Weimer,
George C. Necula:
Exceptional situations and program reliability.
ACM Trans. Program. Lang. Syst. 30(2): (2008) |
| 2007 |
| 12 | EE | Pieter Hooimeijer,
Westley Weimer:
Modeling bug report quality.
ASE 2007: 34-43 |
| 2006 |
| 11 | EE | Westley Weimer:
Exception-Handling Bugs in Java and a Language Extension to Avoid Them.
Advanced Topics in Exception Handling Techniques 2006: 22-41 |
| 10 | EE | Westley Weimer:
Patches as better bug reports.
GPCE 2006: 181-190 |
| 2005 |
| 9 | EE | Westley Weimer,
George C. Necula:
Mining Temporal Specifications for Error Detection.
TACAS 2005: 461-476 |
| 8 | EE | George C. Necula,
Jeremy Condit,
Matthew Harren,
Scott McPeak,
Westley Weimer:
CCured: type-safe retrofitting of legacy software.
ACM Trans. Program. Lang. Syst. 27(3): 477-526 (2005) |
| 2004 |
| 7 | EE | Westley Weimer,
George C. Necula:
Finding and preventing run-time error handling mistakes.
OOPSLA 2004: 419-431 |
| 2003 |
| 6 | EE | Jeremy Condit,
Matthew Harren,
Scott McPeak,
George C. Necula,
Westley Weimer:
CCured in the real world.
PLDI 2003: 232-244 |
| 2002 |
| 5 | EE | Thomas A. Henzinger,
Ranjit Jhala,
Rupak Majumdar,
George C. Necula,
Grégoire Sutre,
Westley Weimer:
Temporal-Safety Proofs for Systems Code.
CAV 2002: 526-538 |
| 4 | EE | George C. Necula,
Scott McPeak,
Shree Prakash Rahul,
Westley Weimer:
CIL: Intermediate Language and Tools for Analysis and Transformation of C Programs.
CC 2002: 213-228 |
| 3 | EE | George C. Necula,
Scott McPeak,
Westley Weimer:
CCured: type-safe retrofitting of legacy code.
POPL 2002: 128-139 |
| 2 | EE | Stephen Adams,
Thomas Ball,
Manuvir Das,
Sorin Lerner,
Sriram K. Rajamani,
Mark Seigle,
Westley Weimer:
Speeding Up Dataflow Analysis Using Flow-Insensitive Pointer Analysis.
SAS 2002: 230-246 |
| 2000 |
| 1 | EE | John Kubiatowicz,
David Bindel,
Yan Chen,
Steven E. Czerwinski,
Patrick R. Eaton,
Dennis Geels,
Ramakrishna Gummadi,
Sean C. Rhea,
Hakim Weatherspoon,
Westley Weimer,
Chris Wells,
Ben Y. Zhao:
OceanStore: An Architecture for Global-Scale Persistent Storage.
ASPLOS 2000: 190-201 |