Tokumi Yokohira

2007
15	EE	Tutomu Murase, Hiroki Fujiwara, Yukinobu Fukushima, Masayoshi Kobayashi, Tokumi Yokohira: Performance Evaluation of a Multi-Stage Network Event Detection Scheme for Decreasing the False-Positive Rate for a Large Number of Simultaneous, Unknown Events. ICN 2007: 97
14	EE	Hui Wang, Shigeyuki Osada, Tokumi Yokohira, Kiyohiko Okayama, Nariyoshi Yamai: Effect of Premature ACK Transmission Timing on Throughput in TCP with a Performance Enhancing Proxy. IEICE Transactions 90-B(1): 31-41 (2007)
13	EE	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Transactions 90-D(3): 685-687 (2007)
12	EE	Masataka Yonezu, Nobuo Funabiki, Tomoya Kitani, Tokumi Yokohira, Toru Nakanishi, Teruo Higashino: Proposal of a hierarchical heuristic algorithm for node assignment in bidirectional Manhattan street networks. Systems and Computers in Japan 38(4): 74-83 (2007)
2006
11	EE	Tokumi Yokohira, Kiyohiko Okayama: High-Speed Calculation of Worst-Case Link Delays in the EDD Connection Admission Control Scheme. IEICE Transactions 89-B(7): 2012-2022 (2006)
2005
10	EE	Tokumi Yokohira, Kiyohiko Okayama: Node Placement Algorithms in the Case that Routes are Design Variables in Shuffle-Like Multihop Lightwave Networks. IEICE Transactions 88-B(12): 4578-4587 (2005)
2003
9	EE	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411
2002
8	EE	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium 2002: 417-422
7	EE	Shigeto Tajima, Masakazu Fujii, Nobuo Funabiki, Tokumi Yokohira, Kazufumi Tsunemura, Teruo Higashino: An Optimal Path Selection Algorithm for Static and Mobile Multicast Routing Problems. ICOIN (1) 2002: 193-202
6	EE	Nobuo Funabiki, Toru Nakanishi, Tokumi Yokohira, Shigeto Tajima, Teruo Higashino: A Proposal of a Quasi-Solution State Evolution Algorithm for Channel Assignment Problems. ICOIN (2) 2002: 32-41
1997
5	EE	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247
1996
4	EE	Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium 1996: 68-74
1995
3	EE	Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto: Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265
1990
2		Hiroshi Inai, Takeshi Nishida, Tokumi Yokohira, Hideo Miyahara: End-to-End Performance Modeling for Layered Communication Protocol. INFOCOM 1990: 442-449
1986
1		Tokumi Yokohira, Takeshi Nishida, Hideo Miyahara: Analysis of Dynamic Behavior in p-Persistent CSMA/CD Using Cusp Catastrophe. Computer Networks 12: 277-289 (1986)

Coauthor Index

1	Masakazu Fujii	[7]
2	Hideo Fujiwara	[3] [4] [5]
3	Hiroki Fujiwara	[15]
4	Yukinobu Fukushima	[15]
5	Nobuo Funabiki	[6] [7] [12]
6	Teruo Higashino	[6] [7] [12]
7	Tsutomu Hondo	[8] [9] [13]
8	Hiroshi Inai	[2]
9	Tomoo Inoue	[3] [4] [5]
10	Tomoya Kitani	[12]
11	Masayoshi Kobayashi	[15]
12	Toshifumi Kobayashi	[8] [9] [13]
13	Hiroyuki Michinishi	[3] [4] [5] [8] [9] [13]
14	Hideo Miyahara	[1] [2]
15	Tutomu Murase	[15]
16	Toru Nakanishi	[6] [12]
17	Takeshi Nishida	[1] [2]
18	Takuji Okamoto	[3] [4] [5] [8] [9] [13]
19	Kiyohiko Okayama	[10] [11] [14]
20	Shigeyuki Osada	[14]
21	Shigeto Tajima	[6] [7]
22	Kazufumi Tsunemura	[7]
23	Hui Wang	[14]
24	Nariyoshi Yamai	[14]
25	Masataka Yonezu	[12]

Colors in the list of coauthors